214
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
N16
(822)
Experimental Evaluation of the
Performance of a Photovoltaic Panel with
Water Cooling
Haitham M. Bahaidarah
1
,
Shafiqur Rehman
2
1
Mechanical Engineering Department, King Fahd
University of Petroleum & Minerals, Dhahran,
Saudi Arabia,
2
Center for Engineering Research,
Research Institute, King Fahd University of
Petroleum & Minerals, Dhahran, Saudi Arabia
N18
(823)
Investigation of Pilling Strength and
Bus Bar Surface Roughness for Solar Cell
Soldering
Wen-Tai Chung, Yi-Te Wu, Chien-Wen Chen,
Po-Wen Wang, Meng-Lin Lin, Tsai-Yuan Lin, Chih-
Hsyong Wu
Motech Industries, Inc., Tainan, Taiwan
N20
(824)
A Methodological Roadmap for Reliability
Alessandra Colli
Brookhaven National Laboratory, Upton, NY, USA
N22
(825)
Outdoor Performance Testing of Thin-
Film PV Modules in the Hot and Humid Climate
Neelkanth G. Dhere, Ashwani Kaul, Shirish a.
Pethe, Narendra Shiradkar, Eric Schneller
Florida Solar Energy Center, Cocoa, FL, USA
N24
(826)
Evaluation of non-uniform mechanical
loads on solar modules
Sascha Dietrich, Matthias Ebert, Ulli Zeller,
Matthias Pander
Fraunhofer Center for Silicon-Photovoltaics, Halle
(
Saale), Germany
N26
(827)
Comparing PV Power Plant Soiling
Measurements Extracted from PV Module
Irradiance and Power Measurements
Lawrence Dunn
1
,
Bodo Littmann
2
,
J. Riley Caron
2
,
Michael Gostein
1
1
Atonometrics, Austin, TX, USA,
2
First Solar, San
Francisco, CA, USA
N28
(828)
Field Discoloration Analysis and UV/
temperature Accelerated Degradation Test of
EVA for PV
Jae-Seong Jeong, Nochang Park
Korea Electronic Technology Institute, Seongnam-
City, South Korea
N30
(829)
Accelerated Life Testing of PV Arc-Fault
Detectors
Jay Johnson
1
,
Michael Neilsen
1
,
Paul Vianco
1
,
N. Rob Sorensen
1
,
Michael Montoya
1
,
Armando
Fresquez
1
,
Chris Oberhauser
2
1
Sandia National Laboratories, Albuquerque, NM,
USA,
2
Texas Instruments, Santa Clara, CA, USA
N32
(830)
Determination of Moisture Ingress Rate
through Photovoltaic Encapsulants
Jane Kapur
1
,
Jennifer L. Norwwod
1
,
Colin D.
Cwalina
1,2
1
E. I. DuPont de Nemours & Co, Wilmington, DE,
USA,
2
University of Delaware, Newark, DE, USA
TECHNICAL PROGRAM
