JUNE 8-13, 2014 • DENVER, COLORADO
89
TECHNICAL PROGRAM
Area 12 - Orals
1:30 - 3:00 PM
Ballroom 2B
PID
Chair(s): Mike Kempe, Carole Graas
1:30
(268) Thin Film PID Field Failures and Root
Cause Determination
Michelle L Propst, N.Anders Olsson
pearllaboratories, Fort Collins, CO, USA
2:00
(269) Theory and numerical simulation of the
physical processes involved in the potential-
induced degradation of conventional silicon
solar cells
Nitsa Kindyni, Constantinos Lazarou, George E.
Georghiou
FOSS Research Center for Sustainable Energy,
Photovoltaic Technology Group, Department of
Electrical and Computer Engineering, University of
Cyprus, Nicosia, Cyprus
2:15
Best Student Presentation Award Finalist
(270) Application of Reverse Bias Recovery
Technique to Address PID Issue: Incompleteness
of shunt resistance and quantum efficiency
recovery
Jaewon Oh
1
, Stuart Bowden
1
, GovindaSamy
TamizhMani
2
1
Solar Power Laboratory, Arizona State University,
Tempe, AZ, USA,
2
Photovoltaic Reliability
Laboratory, Arizona State University, Mesa, AZ, USA
2:30
(271) Application of the Terrestrial Photovoltaic
Module Accelerated Test-to-Failure Protocol
Peter Hacke
1
, Kent Terwilliger
1
, Stephen Glick
1
,
Ryan Smith
2
, Greg Perrin
1
, Sarah Kurtz
1
, Nick
Bosco
1
, John Wohlgemuth
1
1
National Renewable Energy Laboratory, Golden,
CO, USA,
2
Pordis, Austin, TX, USA
2:45
(272) Investigation of c-Si Modules Degradation
and Recovery Effect under High Potentials
Bengt Jaeckel
1
, Marijo Cosic
2
, Jürgen Arp
3
1
UL International GmbH, Neu-Isenburg, Germany,
2
UL International GmbH, Neu-Isenburg, Germany,
3
PV LAB Germany GmbH, Potsdam, Germany
3:00 - 3:30 PM
Exhibit Hall D
Coffee Break
